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Defect Oriented Testing For Nano Metric CMOS VLSI Circuits

By: Sachdev ManojContributor(s): Pineda Des Gyvez JoseMaterial type: Text

TextPublication details: New Delhi Springer 2010Description: 328ISBN: 9788184894295Subject(s): CMOS | VLISI

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Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	GRIET Library and Information Centre	ECE		Available		82093

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