000			00385nam a2200145Ia 4500
008			170101s2009 xx 000 0 und d
020			_a9788184890297
100			_aGrout Ian A
245		0	_aIntegrated Circuit Test Engineering Modern Techniques
260			_aNew Delhi _bNew Age International _c2009
300			_a362
650			_aElectronics
650			_aLIC
942			_2ddc _cBK
999			_c717743 _d717743